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Advanced Microscopy

Advanced microscopy techniques such as SEM (Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy) are essential techniques to investigate sample microstructure, morphology, particle size, particle coatings and defects. These techniques often employ elemental mapping capabilities such as EELS (Electron Energy Loss Spectroscopy) and EDS (Energy Dispersive X-Ray Spectroscopy) which provide valuable information about elemental composition and location/distribution.

EAG offers a broad range and large installed base of different microscopy tools and services to match your application, ranging from process development to failure analysis. In addition to providing high resolution imaging, our analytical capability makes us a unique partner that can help you during research, development, and analysis of failures.

Microscopy techniques can be used to characterize many types of defects.  These include:

  • Metal migration: FIB cross-section and investigation by STEM/EDS
  • Voids: FIB cross-section and investigation by SEM
  • Particles: Surface imaging or FIB cross-section to investigate size, chemistry and position in the layer stack
  • Cracks and Delaminations: Small area FIB cross-sections or large area argon ion milled cross sections determine the location and of the delaminated interface. If needed, the interface chemistry can then be determined by TEM micro-analysis.
  • Thickness and Uniformity: FIB cross-section and investigation by SEM

The types of materials tested using advanced microscopy techniques:

  • Nanoparticles
  • Alloys and metals
  • Thin films
  • Coatings on glass, silicon or carbon-based substrates
  • Ceramics
  • Composite materials
  • IC devices
  • Aluminum anodization