Automatic Test Equipment (ATE) Techniques
EAG Laboratories is a leading service provider for semiconductor and system level automated test equipment (ATE).
Teradyne Test Systems:
We have the latest Teradyne test systems to support your test needs including logic, RF, analog, mixed-signal, and memory technologies. These systems test simple low end devices to complex high speed/high frequency ICs that are used in a variety of end applications. The FLEX family of testers incorporates architecture to provide efficiency and flexibility for a wide range of devices and markets.
Our Teradyne Test Platforms include:
- Catalyst RF
Advantest Test Systems
We also have the most up to date Advantest test systems to help you with your test needs including dc, analog, digital, and memory technologies. Our V93000 systems can be used to test simple low end devices to complex high speed/high frequency ICs that are operated in a diverse set of end applications. The V93000 are built on scalable platform architecture and a modular design to adapt to changing test requirements and maximize re-use of hardware and test programs.
Our Advantest Test Platforms include:
- V93000 Pin Scale
- V93000 SoC / Smart Scale