Electron Backscatter Diffraction (EBSD)
Electron Backscatter Diffraction (EBSD) is a technique that is uniquely suited to characterize crystallographic properties of your samples. Proprieties such as: grain size, grain orientation, misorientation, deformation, texture and grain aspect ratio can all be characterized by this technique.
EBSD Analysis is a great complement to the excellent capabilities of our X-ray diffraction (XRD) services. While our XRD tools and staff can provide unparalleled information on phase ID, nanocrystalline grain size, thin film thickness and textures; the new capabilities available by EBSD will provide a more complete description of your crystalline samples.