for Materials Characterization & Surface Analysis

Find out which technique is right for you.

Identify Components of
Organic Volatile
& Semi-Volatile Compounds

Learn more about EAG GC-MS analysis services.

Detailed Surface & Near-Surface Images with SEM Analysis

Learn about EAG
Scanning Electron Microscopy services.

Surface Analysis and Materials Characterization Expertise

Int'l Conference on Compound Semiconductor Manufacturing Technology (CS Mantech), 16-19 May, Miami, FL

International Meeting on Lithium Batteries (IMLB), 19-24 June, Chicago, IL

InterSolar Europe, 22-24 June, Munich, Germany

SEMICON West, 12-14 July, San Francisco, CA

16th International Conference on Atomic Layer Deposition, 24-27 July, Dublin, Ireland

Working Smarter Seminar, 28 July, Sunnyvale, CA

The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG's expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.

Our staff and equipment are dedicated to one goal: to enable our customers to advance by providing the highest quality analytical results as quickly as possible.

From laser optics to medical devices, from raw materials to solar panels or high speed processors, our analytical expertise can help you develop new processes and materials faster, transfer those processes to production, qualify new tools, solve production problems, and much more.

How can we be of service?

need more?

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 tem  tga  tof-sims  txrf  xps  xrd

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