Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)

In Laser Ablation Inductively Coupled Plasma Mass Spectrometry the sample is directly analyzed by ablating with a pulsed laser beam. The created aerosols are transported into the core of inductively coupled argon plasma (ICP), which generates temperature of approximately 8000°C. The plasma in ICP-MS is used to generate ions that are then introduced to the mass analyzer. These ions are then Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) technique from Evans Analytical Group (EAG).separated and collected according to their mass to charge ratios. The constituents of an unknown sample can then be identified and measured. ICP-MS offers extremely high sensitivity to a wide range of elements.

For laser ablation, any type of solid sample can be ablated for analysis; there are no sample-size requirements and no sample preparation procedures. Chemical analysis using laser ablation requires a smaller amount of sample ( micrograms) than that required for solution nebulization (milligrams). Depending on the analytical measurement system, very small amount of sample quantities may be sufficient for this technique. In addition, a focused laser beam permits spatial characterization of heterogeneity in solid samples, with typically micron resolution both in terms of lateral and depth conditions.

For Trace Elemental Analysis using GDMS, IGA, ICP-OES or LA-ICP-MS:

Evans Analytical Group (New York) - Sample Submittal Form (English, pdf)
Evans Analytical Group SAS (France) - Sample Submittal Form (English, pdf)
Evans Analytical Group SAS (France) - Sample Submittal Form (French, pdf)


  • Major, minor and trace level compositional analysis of conductive, semi-conductive and nonconductive materials
  • Contamination of plastics, pharmaceuticals organics or biological materials
  • Failure, contamination and inclusion analysis
  • Forensics analysis
  • Environmental and mineral sample analysis
  • Elemental distribution analysis

Signal Detected: Ions

Elements Detected: Up to 70 elements

Detection Limits: ppb

Depth Resolution: ~1 μm

Lateral Resolution - Spot Size: 4 - 100μm

  • Direct sampling multielement quantitative or semi-quantification at the surface and bulk for elemental composition of solids
  • No chemical procedures for dissolution
  • Reduced risks of analyte loss or cross-contaminations
  • Independent of sample geometry
  • Analysis of very small samples
  • Determination of spatial distribution of elemental compositions
  • The common matrix elements and other molecular species can interfere with the determination of some elements. Some doubly charged or molecular ionic species create difficulties in quantifications.
  • Glass and ceramics
  • Forensics
  • Semiconductor manufacturing
  • Geological
  • Failure Analysis
Sign Up to Receive our Enewsletter
© Copyright 2016 EAG Inc.     |    All Rights Reserved     |    Privacy Policy     |    Legal