SIMS Theory Tutorial

Introduction

Bombardment of a sample surface with a primary ion beam followed by mass spectrometry of the emitted secondary ions constitutes secondary ion mass spectrometry (SIMS).

The best SIMS reference is Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, by A. Benninghoven, F. G. Rüdenauer, and H. W. Werner, Wiley, New York, 1987 (1227 pages).

  
Sign Up to Receive our Enewsletter
© Copyright 2015 EAG Inc.     |    All Rights Reserved     |    Privacy Policy     |    Legal