Training Seminars

Working Smarter™ with Surface Analytical Techniques

The Working Smarter seminar reviews many surface, bulk, and microanalytical techniques used in high technology industries. This course has been designed to provide engineers and scientists with the information needed to effectively apply sophisticated surface analytical tools and techniques in materials research, process development, failure analysis, and production quality control applications. Attendees will increase their knowledge of analytical methods and their understanding of how these techniques can then be applied most effectively to different technologies, problem solving, or research situations.

The Semiconductor version is primarily focused on semiconductor materials. The General version includes examples from a broader range of industries including semiconductor, optics, glass, solar and more. The Organic Materials version of the course includes examples and case studies utilizing techniques such as FTIR, NMR, LC/MS, and GC/MS.

The Working Smarter series has been running for over 20 years, and is the leading tutorial seminar on surface and micro-analytical techniques.

Who Should Attend?

Engineers, scientists, technicians, lab managers, production and R&D personnel will increase their knowledge of analytical methods and their understanding of how these techniques can be applied most effectively to different technologies, problem solving, or research situations.

This course will benefit anyone facing materials or materials processing related problems that could be addressed by surface analysis, microanalysis or other materials characterization methods. The experienced professional will gain a new breadth of knowledge in techniques complementary to their core skills, while individuals new to the field will come away with a good overview of the range and application of many powerful techniques.

What You Will Learn:

  • The best techniques and instrumentation for surface, bulk, and thin film characterization of semiconductor and other materials.
  • The techniques that are best used in different applications and circumstances.
  • The basic fundamentals of each technique (i.e. how do they work?)
    *Note that the operation of specific instruments is not discussed.
  • How to better understand the data in order to get the most information from your analysis.
  • Strengths and limitations of each technique.

Why Take This Seminar?

With the knowledge gained from this seminar, participants will be able to make more informed decisions and choices about which technique to use, thereby improving efficiency and reducing the potential cost of analytical services. EAG will always be available to help you with different analytical approaches.

Semiconductor Course Contents:

An Introduction to Surface and
Microanalytical Tools

Microanalytical Techniques
Atomic Force Microscopy (AFM)
Optical Profilometry (OP)
Scanning Electron Microscopy (SEM)
Energy Dispersive X-ray Spectroscopy (EDS)
Electron Beam Induced Current (EBIC)
Focused Ion Beam Imaging (FIB)
Transmission Electron Microscopy (TEM)
Scanning TEM (STEM)
Auger Electron Spectroscopy (AES)

Surface Organic Techniques
X-ray Photoelectron Spectroscopy (XPS)
Time-of-Flight Secondary Ion Mass Spectrometry
(TOF-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Raman Spectroscopy

Thin Film Techniques
Accelerator Techniques: RBS, HFS, PIXE, NRA
Low Energy X-ray Emission Spectrometry (LEXES)
X-ray Reflectivity (XRR)
X-ray Fluorescence (XRF)
X-ray Diffraction (XRD)
Electron Backscatter Diffraction (EBSD)

Fundamentals and Applications of SIMS
Secondary Ion Mass Spectrometry (SIMS)

Surface and Trace Metal Analysis Techniques
Vapor Phase Decomposition (VPD)
Total Reflection X-ray Fluorescence (TXRF)
TOF-SIMS for Surface Metals

Summary: Selecting the Appropriate Analytical Technique

General Course Contents:

An Introduction to Surface, Bulk, and
Microanalytical Tools

Microanalytical Techniques
Atomic Force Microscopy (AFM)
Optical Profilometry (OP)
Scanning Electron Microscopy (SEM)
Energy Dispersive X-ray Spectroscopy (EDS)
Transmission Electron Microscopy (TEM)
Scanning TEM (STEM)
Auger Electron Spectroscopy (AES)

Surface Organic Techniques
X-ray Photoelectron Spectroscopy (XPS)
Time-of-Flight Secondary Ion Mass Spectrometry
(TOF-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Raman Spectroscopy
Gas Chromatography - Mass Spectrometry (GC-MS)

Thin Film Techniques
Accelerator Techniques: RBS, HFS, PIXE, NRA
Secondary Ion Mass Spectrometry (SIMS)
X-ray Fluorescence (XRF)
X-ray Diffraction (XRD)
Electron Backscatter Diffraction (EBSD)

Bulk Techniques
Glow Discharge Mass Spectrometry (GDMS)
Instrumental Gas Analysis (IGA)
Inductively Coupled Plasma-Optical Emission
Spectrometry/Mass Spectrometry (ICP-OES/MS)
Laser Ablation-Inductively Coupled
Plasma-Mass Spectrometry (LA-ICPMS)
Thermogravimetric Analysis (TGA)
Differential Scanning Calorimetry (DSC)

Summary: Selecting the Appropriate Analytical Technique

Organic Materials Course Contents:

An Introduction to Surface, Bulk, and Microanalytical Tools

Microanalytical Techniques Atomic Force Microscopy (AFM) Optical Profilometry (OP) Scanning Electron Microscopy (SEM) Energy Dispersive X-ray Spectroscopy (EDS) Focused Ion Beam Imaging (FIB) Transmission Electron Microscopy (TEM) Scanning TEM (STEM) Auger Electron Spectroscopy (AES)

Surface Organic Techniques X-ray Photoelectron Spectroscopy (XPS) Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Fourier Transform Infrared Spectroscopy (FTIR) Raman Spectroscopy

Thin Film Techniques Secondary Ion Mass Spectrometry (SIMS) X-ray Fluorescence (XRF) X-ray Diffraction (XRD)

Polymer, Organic & Thermal Techniques Introduction to Organic & Polymer Analysis Nuclear Magnetic Resonance (NMR) Gas Chromatography - Mass Spectrometry (GC-MS) Liquid Chromatography - Mass Spectrometry (LC-MS) Thermogravimetric Analysis (TGA) Differential Scanning Calorimetry (DSC) Dynamic Mechanical Analysis (DMA)

Case Studies: Processing Failure, Polymer Quantification, Root Cause Investigation

Summary: Selecting the Appropriate Analytical Technique

On-Site Working Smarter

EAG offers Level 1 on-site presentations of our Working Smarter courses. These courses include Semiconductor, General, Biotechnology, and Photovoltaic. All versions feature discussion on fundamental aspects of analytical techniques and differ by including industry specific examples. The onsite seminar provides lower cost per person (10 or more), travel costs are avoided, and most importantly discussion on specific technical issues can occur without concern for IP issues.

EAG also offers Level 2 on-site Working Smarter. Level 2 includes all of Level 1 plus an additional ½ day where results from your company's samples are shown and discussed. Arrangements prior to the seminar determine the type and scope of pre-seminar analysis.

If you are interested in these on-site seminars, please contact us.

 

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