Scanning Electron Microscope (SEM)
Scanning Electron Microscopy (SEM) provides high-resolution and high depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also offers elemental identification of nearly the entire periodic table.
EAG uses SEM analysis in cases where optical microscopy cannot provide sufficient image resolution or high enough magnification. The SEM also excels in producing detailed surface topography images. Applications include failure analysis, dimensional analysis, process characterization, reverse engineering, and particle identification.
EAG’s expertise and range of experience is invaluable to the industries and customers we serve. Person-to-person service ensures good communication of the results and their implications. Customers are often present during the analysis, enabling an immediate sharing of data, imaging and information.