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X-Ray Fluorescence (XRF)

X-ray Fluorescence (XRF) is a non-destructive technique that is used to quantify the elemental compositions of materials and to measure film thickness and composition. X-rays are used to excite the sample, causing the emission of X-rays with energies characteristic of the elements present.

XRF is capable of detecting elements from B-U in concentrations from the ppm range to 100%.  Additionally, Be can be measured in copper.  Because X-rays are used to excite the sample, analysis depths from a few micrometers to several millimeters can be achieved depending on the material. Through the use of appropriate reference standards, or fundamental parameters (FP) when standards aren’t available, XRF can accurately quantify the elemental composition of most materials.

Two XRF systems are available, a wavelength dispersive instrument (WDXRF) and an energy dispersive instrument (EDXRF) with the main difference being the way in which the X-rays are separated and measured. WDXRF has very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF has higher signal throughput which enables small area analysis or mapping.

Ideal Uses
  • Measuring film thickness and composition from the angstrom range up to several micrometers
  • General elemental identification and quantitation in most materials, including metals, ceramics, polymers, or residues
  • Identification of specific metal alloys or types of glass
  • Trace level analysis for contaminants in solid samples
  • Identifying and quantifying inorganic fillers in polymers
Technical Specifications

Signal Detected: X-rays
Elements Detected: B-U (WDXRF); Al-U (EDXRF)
Detection Limits: 1ppm-100ppm for most elements
Imaging/Mapping: Yes (up to 30mm diameter area)
Lateral Resolution/Probe Size: 500µm (WDXRF); 75µm (EDXRF)

  • Non-destructive
    • Whole wafer analysis (up to 300mm) as well as wafer pieces and small samples
    • EDXRF analysis of very large samples: 30cm x 30cm x 15cm (LxWxH)
    • Thickness and composition of multilayer film stacks
  • Can analyze areas as small as ~150µm (EDXRF)
  • Can analyze any solid material
  • Sampling depth ranging from a few micrometers to several millimeters depending on the material
  • Cannot detect elements lighter than Al using small spot EDXRF
  • Highest accuracy measurements require reference standards similar in composition and/or thickness to the test sample