Working Smarter™
The General Working Smarter Seminar is an introduction to surface, bulk, and microanalytical tools. This version includes examples from a broad range of industries including semiconductor, optics, glass, solar and more.
Working Smarter™ seminars are now part of our webinar series
Techniques covered include:
Microanalytical Techniques
- Atomic Force Microscopy (AFM)
- Optical Profilometry (OP)
- Scanning Electron Microscopy (SEM)
- Energy Dispersive X-ray Spectroscopy (EDS)
- Transmission Electron Microscopy (TEM)
- Scanning TEM (STEM)
- Auger Electron Spectroscopy (AES)
Surface Organic Techniques
- X-ray Photoelectron Spectroscopy (XPS)
- Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Raman Spectroscopy
- Gas Chromatography – Mass Spectrometry (GC-MS)
Thin Film Techniques
- Accelerator Techniques: RBS, HFS, PIXE, NRA
- Secondary Ion Mass Spectrometry (SIMS)
- X-ray Fluorescence (XRF)
- X-ray Diffraction (XRD)
- Electron Backscatter Diffraction (EBSD)
Bulk Techniques
- Glow Discharge Mass Spectrometry (GDMS)
- Instrumental Gas Analysis (IGA)
- Inductively Coupled Plasma-Optical Emission Spectrometry/Mass Spectrometry (ICP-OES/MS)
- Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICPMS)
- Thermogravimetric Analysis (TGA)
- Differential Scanning Calorimetry (DSC)