Presentation on Auger (AES) at Surface Analysis 2016
Sankar Raman of EAG Laboratories recently presented an invited talk at the 38th Symposium on Applied Surface Analysis. His presentation, “History, Applications and Advances in Auger Electron Spectroscopy (AES),” began with a brief history of the evolution of AES spectroscopy and instrumentation, followed by highlights of advanced application examples as applied to materials characterization, failure analysis, defect identification and insulating materials. Dr. Raman also presented examples and advantages of AES on samples prepared using modern day sample preparation techniques such as FIB cross-sections for TEM. For more information about EAG’s AES/Auger capabilities, visit http://www.eag.com/auger-electron-spectroscopy.
The event was hosted by the AVS Hudson Mohawk Chapter, the CNSE Student Chapter, and the RPI Student Chapter of the AVS and was held at the Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute on August 16-18, 2016.