Electrical AFM Seminar – May 28, 2015

Presented by Evans Analytical Group and Bruker

Thursday, May 28, 2015 2:00 – 4:00 PM

Nanoscale Electrical Characterization using Atomic Force Microscopy

Peter De Wolf (peter.dewolf@bruker-nano.com) Bruker Nano Surfaces, 112 Robin Hill Road, Santa Barbara, CA 93117, USA

Today, a wide range of AFM-based electrical characterization methods is routinely applied in the study of (nano)-electronics materials and devices. This presentation will give an overview of this family of modes – and discuss the best methods to measure conductivity, charge, surface potential, carrier profiles, piezo-electric and other electrical properties with nanometer scale resolution. Each operating mode will be illustrated with examples from Si-based and compound semiconductors, carbon-based materials (nanotubes, graphene,..) and organic devices.

Recently, this application range has been further expanded with the availability of new methods. An example is the combination of Peak Force Tapping with Conductive (or Tunneling) AFM, providing much longer tip lifetime and also allowing one to measure soft or fragile samples, previously not accessible with contact-based methods. Other improvements focus on environmental control (higher repeatability & reliability) and the elimination of the effect of the AFM laser light (eliminate light-induced artifacts).

About the Speaker Peter De Wolf received his PhD at IMEC, Belgium – and has taken several roles at Bruker Nano Surfaces; from application & development scientist to his current role of worldwide application director. He holds multiple patents and is author of over 40 publications, many focused on the electrical characterization using AFM.

Location: Evans Analytical Group 810 Kifer Road Sunnyvale, CA 94086

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