White Paper: Chemical Structure of Polymer Film Surfaces
Do you need to know the chemical structure of polymer film surfaces? Do you suspect a contamination problem, or something isn’t working quite right?
This white paper focuses on the analytical benefits of using X-ray Photoelectron Spectroscopy (XPS, also called ESCA) and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) to address surface issues.
As a division of Evans Analytical Group (EAG), CHEMIR is pleased to also provide access to a wide range of surface analytical techniques, including these powerful tools.
XPS and TOF-SIMS probe the chemical structure of surfaces, providing actionable information for problem solving and product development. Properties such as adhesion, wettability, appearance, barrier performance, strength and printability are impacted by surface chemistry. In this white paper, learn about:
- Tools available for studying polymer surfaces
- Principles of XPS and TOF-SIMS
- Case studies utilizing these techniques:
- Pressure sensitive adhesive defect analysis, and
- Packaging heat seal failure analysis
- Recent innovations for characterizing deep layers and really thin films
Understanding polymer film surfaces will help your company with product development and problem solving. Read our white paper: Polymer and Interface Characterization of Polymers