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Technical Webinars

EAG Live Webinar events
60:00
Wednesday, September 28, 2022 - Ask the Expert: All Things SIMS
60:00
Wednesday, October 5, 2022 - Plasma FIB
60:00
Wednesday, October 12, 2022 – Surface Analysis: TOF-SIMS, XPS and Auger
60:00
Wednesday, October 19, 2022 - Gas Analysis & Leak Testing for Hermetic Devices
EAG Recorded SMART Chart Webinar Series
60:00
June 29, 2022: Deformulation of Pharmaceutical RLDs: Understanding the Q1/Q2 Sameness Requirements for Complex Generics
60:00
Wednesday, October 6, 2021 – SEM Cathodoluminescence (SEM-CL) Analyses for Materials Applications
60:00
Wednesday, July 22, 2020 - Spectroscopic Ellipsometry
60:00
Thursday, July 23, 2020 - Atom Probe Tomography (APT)
60:00
Wednesday, August 12, 2020 - SMART Chart Webinar Series: LIBS
60:00
Thursday, August 13, 2020 - SMART Chart Webinar Series: GC-MS
60:00
Thursday, September 10, 2020 – SMART Chart Webinar Series: TXRF
60:00
Thursday, September 24, 2020 – SMART Chart Webinar Series: Nanoindentation
60:00
Thursday, October 29, 2020 – Scanning Microwave Impedance Microscopy (sMIM)
60:00
SMART Chart Webinar Series: EBSD
60:00
Wednesday, June 17, 2020 - SMART Chart Webinar Series: IGA
60:00
SMART Chart Webinar Series: FTIR & Raman
60:00
SMART Chart Webinar Series: ICP-OES/MS
60:00
SMART Chart Webinar Series: TOF-SIMS
60:00
SMART Chart Webinar Series: GDMS
60:00
Wednesday, May 13, 2020 - SMART Chart Webinar Series: RBS
60:00
Thursday, May 14, 2020 - SMART Chart Webinar Series: SIMS
60:00
SMART Chart Webinar Series: XPS
60:00
SMART Chart Webinar Series: AFM & OP
60:00
SMART Chart Webinar Series: SEM
60:00
SMART Chart Webinar Series: XRF
60:00
SMART Chart Webinar Series: TEM
60:00
SMART Chart Webinar Series: XRD & XRR
60:00
SMART Chart Webinar Series: AES
Engineering
60:00
Thursday, April 29, 2021 - Testing of High Speed I/O
60:00
Thursday, March 11, 2021 – Electrostatic Discharge (ESD)
60:00
Warpage and Strain Characterization
60:00
Wednesday, October 14, 2020 – Electronic Device Failure Analysis
60:00
Wednesday, November 18, 2020 – Circuit Edit Focused Ion Beam (CEFIB)
47:37
Latch-up on High Current Devices
41:57
Microelectronic Component Product Qualification
05:16
What is Dye & Pry?
36:18
Failure Analysis of Reliability Testing Samples
26:52
Failure Analysis in a Complex World
Materials Sciences
60:00
Wednesday, May 4, 2022 - Polymer Additive Manufacturing: Microstructure & Failure Analysis
60:00
Wednesday, November 10, 2021 – Multiscale Assessment on the Quality of Metal Powder Feedstocks for Additive Manufacturing
60:00
Wednesday, August 25, 2021 - Multi-Scale 2D and 3D Investigations of Li-Ion Battery Electrode
60:00
Wednesday, June 23, 2021 – Material Reliability and Characterization in Europe
60:00
Wednesday, May 5, 2021 - Chamber Clean Analysis
60:00
Thursday, March 25, 2021 – MicroLED Analysis
60:00
Thursday, February 25, 2021 - Full Survey Chemical Analysis of Materials Used in Energy Storage Devices
60:00
Wednesday, March 3, 2021 – Characterization of Plasma Altered Polymer Surfaces
60:00
Thursday, March 18, 2021 – Characterization of Bioceramics for Surgical Implants
60:00
Thursday, April 1, 2021 – EAG Analytical Capabilities in Europe
60:00
Metal-Based Additive Manufacturing (3D Printing)
60:00
Polymers in Medical Devices
60:00
Wednesday, July 29, 2020 - Trace and Ultra-trace Elemental Analysis
60:00
Thursday, August 20, 2020 - Application of Electron Microscopy to Lithium Ion Batteries
60:00
Thursday, August 27, 2020 - Advanced FIB: Cryo, 3D reconstruction and more
60:00
Thursday, September 17, 2020 – Reliability Testing
60:00
Thursday, November 12, 2020 – Analyses of Modified Glass Surfaces and Thin Coatings on Glass
60:00
PCOR-SIMS Analysis of GaAs pHEMT and GaN HEMT
60:00
The Metallurgists Toolbox: Fractography
60:00
Thursday, December 10, 2020 – Full Survey Chemical Analysis of Plasma Resistant Ceramic Coatings
60:00
Wednesday, June 10, 2020 - The Metallurgists Toolbox: Metallography
60:00
Thursday, June 18, 2020 - Precession Electron Diffraction (PED)
60:00
Thursday, January 21, 2021 – Glass Analysis: Chemical and Physical Measurements
60:00
Thursday, January 28, 2021 – Characterization and Failure Analysis of Optoelectronic Materials and Devices
60:00
Thursday, June 25, 2020 - Application of EDS and EELS in Analytical TEM
60:00
Webinar: Particle Characterization
59:44
Are You Prepared for the New Requirements of the EU’s Medical Device Regulation?
35:22
Analytical Approaches for Solving Food and Beverage Challenges
21:58
Thin Film Analysis
41:02
Everything You Always Wanted to Know About Analyzing VCSELs
29:44
Analytical Investigations of Plastics and Polymers
15:09
Make it Safe: Extractable Leachable Studies for Consumer Products
12:40
Will the Newest Wearable Device Leave You Itching for More?
14:57
Advances in Materials and Surfaces Characterization of Medical Devices

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