Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) is the next generation of imaging tools capable of providing information at the Angstrom scale. EAG is proud to be the first independent analytical lab to provide AC-STEM capabilities to its customers. AC-STEM significantly improves the resolution of the traditional STEM tools, providing resolution of better than 0.14 nm on our Hitachi HD2700.
The improvement in resolution and sensitivity that AC-STEM pro-vides is universally applicable for investigations of nanometer scale materials. We specialize in studies involving ultrathin films, nanoparticles, complex interfaces, multiphase materials, interlayer mixing, grain boundary engineering, and surface phenomena.