Our Techniques

The EAG SMART (Spectroscopy and Microscopy Analytical Resolution Tool) Chart shown below offers a concise visual reference for comparing analytical techniques. Easily compare the detection limits and analytical resolutions of dozens of techniques used for materials characterization, evaluation surface analysis, purity surveys and more. Select a technique to learn more or contact an EAG Scientist. Download a printable version of this chart or view our SMART Chart Webinar series

Scroll to the bottom of this page to view a list of all our in-house techniques.

STEM
/EELS

Nanometer scale elemental identification and mapping with TEM and STEM

STEM
/EDS

Elemental composition of small areas with a 1-2 nm range using STEM imaging

Auger

Quantitative elemental analysis of samples with small surface areas

SEM
/EDS

Elemental composition of small areas with a 0.1-3 μm range using SEM imaging

Raman

Ideal for qualitative analysis of organic, inorganic and mixed materials

XPS
/ESCA

Surface analysis technique to determine quantitative atomic composition and chemistry

XRD

Non-destructive technique for characterization of crystalline materials

Ellipsometry

Precise thin film thickness and optical constants measurements

XRR

Determination of thickness, interface roughness and density for thin films and multilayers

FTIR

Quick identification of complex mixtures of materials and further characterization

XRF

Non-destructive elemental analysis for film thickness and composition measurements

RBS

Quantitative compositional thin film analysis without reference standards

D
H
E
M

Depth profiling for electrical properties including carrier concentration and mobility

Atom
Probe

3D atom map, element distribution and nanoscale structure characterization

NanoIR

NanoIR combines AFM with infrared spectroscopy

SEM-CL

High-resolution digital cathodoluminescene (CL) images of luminescent materials

LIBS

Characterize relative element abundances and element distribution in any solid sample

TOF-SIMS

Surface microanalysis at ppm range and near complete characterization of materials

LA-
ICPMS

High precision elemental and stable isotope analysis of solid materials

TXRF

Highly surface-sensitive technique for analyzing surface metal contamination

Dynamic SIMS

Unrivaled capabilities in SIMS analysis for dopant and impurity detection

TEM/STEM

Chemical analysis and characterization at the nano scale with great spatial resolution

EBSD

Visualization of microstructure with spatial coordinates of crystalline samples

PED

Provides visualization of material phase, crystal structure and stain level at nanometer (nm) scale

SEM

High-resolution surface topography images with elemental microanalysis and particle characterization

AFM

3D topographic imaging for surface roughness quantification and further characterization

FIB

High-resolution cross-section images of samples for SEM, STEM and TEM analysis

Nanoindentation

Mechanical characterization of highly-localized material properties

EBIC

SEM-based technique for semiconductor failure analysis and device characterization

OP

Surface topography characterization for a wide range of sample geometries and dimensions

RTX

Non-destructive, real time inspection of electronic components and metallurgical samples

G
D
M
S

Direct analysis of chemical composition and trace/ultra-trace level determinations

E
V
T
ETV-ICP-OES: Rapid, direct determination of analytes with minimal preparation at ultra-trace levels
I
C
P

Quantitative chemical analysis with high sensitivity for a wide range of elements

I
C

High-throughput, versatile technique for charged molecule analysis

G
C
M
S

Identify and quantify organic compounds in mixtures with low detection limits

L
C
M
S

Identification, quantitation and mass analysis of materials in a complex matrix

I
G
A

Measure gas-forming elements (C, H, O, N and S) in solids from ppm to percentage levels

T
G
A

Thermal stability and degradation measurements from physical and chemical changes

D
S
C

Thermal analytical tool for best processing temperatures, sample composition and quality

N
M
R

Chemical structure and composition analysis with quantitative information

G
P
C

Characterization of polymers and other macromolecules in mixtures

Technique List

Would you like to learn more about our techniques?

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