
Electronic Device Failure Analysis Webinar
In this webinar we introduce failure analysis of ICs and other components in the product development cycle and for improving current products
Depending on our clients’ needs, labs within EAG have various certifications, accreditations, regulatory approvals and/or licenses.
For questions about our quality management system, you can reach our quality team here
EAG is committed to excellence in our professional practices, to offering world-class analytical testing services, and to continually improving our quality management system. Our mission to achieve total customer satisfaction by delivering on-time, accurate analyses is engraved in the backbone of our quality system. In keeping with this commitment, we have a number of controls in place to assure the effectiveness and efficiency of our quality system:
Our testing laboratories are registered with the DDTC (Directorate of Defense Trade Controls). A Technology Control Plan is in place to ensure compliance with all EAR (Export Administration Regulations) and ITAR (International Traffic in Arms Regulations). Our scientists and staff are experienced with the data security requirements in regards to EAR, ITAR and military standards.
You may view and download certifications and accreditations for many of our laboratories below.
International Quality Management Standard
International Standard for calibration and testing laboratories
International Quality Management Standard
For DPA and RGA testing at Los Angeles/El Segundo, CA location. Lab is suitably equipped to perform testing on military devices for MIL-STD-750 and MIL-STD-883.
Covering electronic components, assemblies, related materials and processes
In this webinar we introduce failure analysis of ICs and other components in the product development cycle and for improving current products
May 15, 2024
Check out our online symposium presented by EAG Laboratories and Exponent!
FTIR, Raman and NanoIR are particularly well suited at determining the identity and molecular structure of organic materials, however they can also obtain some inorganic information too.
In this webinar we introduce Plasma Focused Ion Beam (P-FIB) which is a instrument that combines a SEM with a plasma-based FIB.
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