Electron Backscatter Diffraction (EBSD) is a technique that is uniquely suited to characterize crystallographic properties of your samples. Proprieties such as: grain size, grain shape, grain orientation, grain boundary misorientation, spatial distribution of phases, local deformation and texture can all be characterized by this technique.
EBSD Analysis is a great complement to the excellent capabilities of our X-ray diffraction (XRD) services. While our XRD tools and staff can provide unparalleled information on phase ID, nanocrystalline grain size, thin film thickness and textures; the new capabilities available by EBSD will provide spatial information, help to visualize the microstructure and add to a complete description of your crystalline samples.
EBSD – Electron Back Scatter Diffraction is a technique using the electron beam of a SEM to differentiate the crystallographic orientations of grains on a sample surface. From EBSD we obtain:
Contact us today for your Electron Backscatter Diffraction (EBSD) needs. Please complete the form below to have an EAG expert contact you.
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