EAG Laboratories provides optimized services that bring you the resources, tools, instruments and the talents of an ATE test engineering staff that will help you resolve your semiconductor testing needs and challenges, achieve your goals and meet your deadlines. We can provide a limited scope project or a full turnkey solution where we analyze a data sheet and provide a comprehensive test plan.
Our wide range of ATE test equipment and experienced team can support first silicon debug thru release to high volume production for a wide range of products, ranging from Digital to RF, including wafer sort and packaged part testing. Test platforms include Teradyne™ and Advantest.
Whether you want a single product tested, or you are considering outsourcing all of your testing services, as a full turn-key solutions provider, EAG will meet your requirements. EAG’s professional ATE development services are comprehensive and utilize standardized test development modules providing cost effectiveness, efficiency and fast development times.
We have product and test engineers experienced in high speed digital, mixed signal, RF and complex SOC products. Our in-house PCB team can handle complex hardware and load board design. We start with review of the product and datasheet, determine the tests required based on product parameters and specifications, and formulate a test plan in addition to selecting the right tester platform.
We can assist you with the following ATE development services:
We have the latest Teradyne test systems to support your test needs including logic, RF, analog, mixed-signal, and memory technologies. These systems test simple low end devices to complex high speed/high frequency ICs that are used in a variety of end applications. The FLEX family of testers incorporates architecture to provide efficiency and flexibility for a wide range of devices and markets.
We also have the most up to date Advantest test systems to help you with your test needs including dc, analog, digital, and memory technologies. Our V93000 systems can be used to test simple low end devices to complex high speed/high frequency ICs that are operated in a diverse set of end applications. The V93000 are built on scalable platform architecture and a modular design to adapt to changing test requirements and maximize re-use of hardware and test programs.
Contact us today for your ATE Test & Engineering needs. Please complete the form below to have an EAG expert contact you.
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