ATE Test & Engineering

EAG Laboratories provides optimized services that bring you the resources, tools, instruments and the talents of an ATE test engineering staff that will help you resolve your semiconductor testing needs and challenges; achieve your goals and meet your deadlines. We can provide a limited scope project or a full turnkey solution where we analyze a data sheet and provide a comprehensive test plan

Our wide range of ATE test equipment and experienced team can support first silicon debug thru release to high volume production for a wide range of products, ranging from Digital to RF, including wafer sort and packaged part testing. Test platforms include Teradyne and Advantest.

  • 24 x 7 engineering and production floor
  • Online reservation system
  • Large and experienced engineering, technical, and production support teams
  • Large inventory of peripherals, temp forcing units, probers and handlers

ATE Production Services

  • Wide Range of Production Services EAG’s production services offer our clients low cost, faster index time, and improved test yield solutions. You can select from a broad range of services that are available and we will supply the equipment and qualified operators for your program. EAG provides a wide range of services including Final Test, Wafer Sort, Ball/Lead Scan, Post-test Marking, Tape and Reel, Bake and Dry Pack, Quality Control System, Document Management, Archive Data, Yield, Binning, Statistics, and complete Product Engineering Support for Production. Support with a personalized, local focus helps you drive productivity and minimize costs.
  • Wide Range of Testers EAG has expanded our ATE test instrument capacity so our clients have access to the tools that they know with testers from Teradyne™, Advantest and Eagle. EAG can meet your needs for testing Digital, Mixed Signal and RF devices in a variety of different packages and pin counts. You choose the platform and we will provide you the level of services that meets your needs. Use our in-house team or use your own engineers.

ATE Development Services

Whether you want a single product tested or you are considering outsourcing all of your testing services, as a full turn-key solutions provider EAG will meet your requirements. EAG’s professional ATE Development Services are comprehensive and utilize standardized test development modules providing cost effectiveness, efficiency and fast development times.

We have product and test engineers experienced in high speed digital, mixed signal, RF, and complex SOC products. Our in-house PCB team can handle complex hardware and load board design. We start with review of the product and datasheet, determination of the tests required based on product parameters and specifications, and formulate a test plan in addition to selection of the right tester platform.

We can assist you with the following ATE development services:

  • Test plan development
  • Load board design
  • Test program development
  • Test program and device debug
  • Expert project management
  • Electrical characterization of new products
  • Test limit evaluation
  • Test time optimization
  • Test cost reductions
  • Vector conversion
  • Multi-site conversion
  • Platform conversion
  • Other customer defined projects
Teradyne Test Systems

We have the latest Teradyne test systems to support your test needs including logic, RF, analog, mixed-signal, and memory technologies. These systems test simple low end devices to complex high speed/high frequency ICs that are used in a variety of end applications. The FLEX family of testers incorporates architecture to provide efficiency and flexibility for a wide range of devices and markets.

Our Teradyne Test Platforms include:

  • Catalyst RF
  • Ultraflex-24
  • Iflex
  • IP750
  • J750
  • J750EX
  • ETS-364
Advantest Test Systems

We also have the most up to date Advantest test systems to help you with your test needs including dc, analog, digital, and memory technologies. Our V93000 systems can be used to test simple low end devices to complex high speed/high frequency ICs that are operated in a diverse set of end applications. The V93000 are built on scalable platform architecture and a modular design to adapt to changing test requirements and maximize re-use of hardware and test programs.

Our Advantest Test Platforms include:

  • V93000
  • V93000 Pin Scale
  • V93000 SoC / Smart Scale

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