Accurate Composition and Quantification of Materials – RBS
RBS is the one technique where we can really say that the composition and concentration are accurately determined for thin films.
EAG’s analytical support services for lighting result in production cost savings, improved lot-to-lot product performance and accelerated product development. We provide world-leading support of research, development and fast-response production monitoring for both conventional and LED lighting manufacturing.
EAG has a long history in the field of lighting testing and analysis, supporting both conventional and LED lighting product development. Our experts provide consulting services for lighting products and raw materials, due to our vast knowledge of application conditions and regulations for lighting materials.
WE KNOW HOW to improve your performance.
EAG offers a comprehensive suite of services for the lighting industry, meeting the industry’s exacting standards for tight controls of material properties, composition and chemistry. Here are just a few ways we can help for both conventional and LED applications:
We support LED analysis at all levels:
We offer the following range of services to answer questions and address issues related to all LED product component and materials at different manufacturing stages.
We offer identification and compositional analysis of polymers (e.g. silicones), metals, gases, LED phosphors, quantum dots, ceramics, contaminants and electrical components.
We offer measurement of light technical parameters of a single LED and complete modules before, during and after testing (e.g. color temperature, color point, luminous intensity, radiation pattern, color over angle, etc.).
Our lighting and LED expertise also enables us to successfully address issues in related industries that have components containing similar materials, or where the products may also be exposed to harsh environments, e.g. automotive components, including lighting, photovoltaic/solar cells, thermal/solar concentrators/mirrors, etc.
Our conventional lighting experts have years of experience troubleshooting and testing conventional lighting products, including:
These types of products often require compositional analyses, such as identifying and characterizing such components of conventional lighting materials such as metals, gases, fluorescent powders, emitter, mercury consumption, tungsten electrodes/materials, pre-coats, feed-through materials, ceramics, glass, contaminants
or electrical components.
Examples of quality control and contamination studies for conventional lighting products:
EAG offers surface and thin film characterization to understand composition, surface contamination and surface topography, as well as measuring thin film thickness, defects and optical properties. Our analytical support for LED R&D includes packaging development and contamination analysis, in addition to burn-in and reliability testing to LM-80 standards. EAG scientists are experts in the characterization of epitaxial films for identity, structure, grain size and orientation, composition, dopants and contaminants.
We offer a broad range of analytical services developed exclusively for LED characterization:
We understand the need for first-to-market breakthrough technologies, and EAG can collaborate to provide results-driven solutions to the most complex of analytical investigations. Our experienced experts will work with your team to troubleshoot and choose the right material for your application or improve a manufacturing process.
Contact us today for your LED and lighting analytical needs. Please complete the form below to have an EAG expert contact you.
RBS is the one technique where we can really say that the composition and concentration are accurately determined for thin films.
EDS and EELS can be coupled with SEM, STEM and TEM to determine the elemental composition, spatial distribution and segregation of elements.
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
In this application note, we show the possibility to extract distance information at an atom-column to atom-column basis with picometer level precision.
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