Electron Back Scatter Diffraction (EBSD) uses the electron beam of an SEM to provide a nanoscale look at a material’s microstructure–providing insight into critical properties such as fatigue, fracture strength, corrosion resistance, creep, ductility, and hardness.

EAG continues to add new analytic functionality to help customers with a need for particle analysis to better identify and measure across a wide dispersion of particles. Automotive, aerospace, and semiconductor manufacturers can rely on EAG’s scientific expertise to provide comprehensive reporting with this new feature.

Understanding the composition of materials, their physical structures, chemical properties and composition, is critical whether looking for improved performance or the cause of failure. There’s no better place to learn these than a one-day seminar at EAG!