Electron Back Scatter Diffraction (EBSD) uses the electron beam of an SEM to provide a nanoscale look at a material’s microstructure–providing insight into critical properties such as fatigue, fracture strength, corrosion resistance, creep, ductility, and hardness.

EAG continues to add new analytic functionality to help customers with a need for particle analysis to better identify and measure across a wide dispersion of particles. Automotive, aerospace, and semiconductor manufacturers can rely on EAG’s scientific expertise to provide comprehensive reporting with this new feature.

Eurofins EAG Materials Science, in association with Applied Spectra, are proud to invite you to register for our Laser Induced Breakdown Spectroscopy and Laser Ablation ICP-MS Active Learning Workshop in Syracuse, NY.