Electron Back Scatter Diffraction (EBSD) uses the electron beam of an SEM to provide a nanoscale look at a material’s microstructure–providing insight into critical properties such as fatigue, fracture strength, corrosion resistance, creep, ductility, and hardness.

Learn how our highly experienced engineering team uses their industry knowledge and years of real world experience with the latest semiconductor technologies to optimize our customer’s latch-up results.

Eurofins EAG Materials Science, in association with Applied Spectra, are proud to invite you to register for our Laser Induced Breakdown Spectroscopy and Laser Ablation ICP-MS Active Learning Workshop in Syracuse, NY.