October 11, 2023
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding materials analysis with various X-ray and ion beam analytical techniques.
October 18, 2023
FA plays a critical role in product development and improvement. During this live Ask the Expert event, we will answer pre-submitted questions from our audience about electronic device failure analysis.
October 25, 2023
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding characterization of polymeric materials used for product development, R&D, and failure analysis.
Please check back as we are continuing to add more live webinars. Below are recorded webinars from previous events:
This webinar is an introduction to Auger Electron Spectroscopy. It will include the principles of the technique with examples.
This webinar will introduce you to AFM and OP, with a overview of the theory of each technique and representative examples of them in action.
In this webinar we introduce Atom Probe Tomography (APT) which is a technique that provides three-dimensional (3D) chemical and spatial maps.
This webinar will focus on Electron Backscatter Diffraction (EBSD) and Electron channeling contrast imaging (ECCI)
In this webinar we introduce Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS)
In this webinar we introduce failure analysis of ICs and other components in the product development cycle and for improving current products
In this webinar we will focus on Spectroscopic Ellipsometry (SE) which is a powerful analytical tool for the characterization of thin films.
In this webinar we introduce electrostatic discharge (ESD) testing which is one of the failure mechanisms for integrated circuit parts
In this webinar we introduce FIB Circuit Edit which allows the cutting of connections and placement of new lines in a semiconductor die
In this webinar we introduce Advanced Focused Ion Beam (FIB) which provides precise cross-section imaging analysis
In this webinar we introduce Fractography which is a failure analysis evaluation technique when components fracture
In this webinar we will focus on Fourier transform infrared (FTIR) and Raman spectroscopies comparing the two techniques
In this webinar we introduce Residual Gas Analysis (RGA), Evolved Gas Analysis (EGA), and Cumulative Helium Leak Detection (CHLD)
In this webinar we will focus on Gas Chromatography-Mass Spectrometry (GC-MS) which allows for the identification of specific molecules
In the full webinar we will focus on full survey chemical analysis using solid sampling high resolution GDMS.
In this webinar we will focus on Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), and ICP-MS
This webinar will focus on Instrumental Gas Analysis (IGA) that measures gas-forming elements present in solid materials.
This webinar is an introduction to Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry for direct elemental and isotopic analysis.
In this webinar we introduce latch-up testing which is relevant for CMOS devices with high static power dissipation.
In this webinar we will focus on Laser Induced Breakdown Spectroscopy (LIBS) which is one of the most versatile chemical analysis approaches.
In this webinar we introduce metallography which is a crucial source of valuable information in the failure analysis process
In this webinar we will focus on Nanoindentation which is a nano-mechanical test that provides the mechanical properties
In this webinar we introduce Precession Electron Diffraction (PED) which has been essential to nano-scale structural analysis
In this webinar we introduce Plasma Focused Ion Beam (P-FIB) which is a instrument that combines a SEM with a plasma-based FIB.
In this webinar we will focus on Rutherford Backscattering Spectrometry (RBS) which is a thin film analysis technique
In this webinar we introduce setting up reliability test plans, processing reliability data and the relation to the lifetime of a product
In this webinar we will focus on SEM Cathodoluminescence (SEM-CL) Analyses for Materials such as compound semiconductors
In this webinar we will focus on Energy Dispersive X-ray Spectroscopy (EDS) and Scanning Electron Microscopy (SEM)
In this webinar we will focus on Dynamic Secondary Ion Mass Spectrometry which used to investigate the elemental structure of materials.
In this webinar will be presenting information on scanning Microwave Impedance Microscopy (sMIM) operation.
In this webinar we introduce analytical techniques used by EAG for surface analysis – XPS, Auger and TOF-SIMS
In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.
In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.
In this webinar we introduce Trace Analysis of Advanced Materials by Direct Solid-Sampling and Solution-Based Techniques
In this webinar we introduce Total Reflection X-ray Fluorescence (TXRF) which is a non-destructive elemental survey technique.
In this webinar we introduce Warpage and Strain Characterization used for non-contact, full-field acquisition of 3D topographies.
In this webinar we introduce X-Ray Photoelectron Spectroscopy (XPS) which is a surface analysis technique.
In this webinar we introduce X-ray Diffraction (XRD) which is a analytical technique for the examination of crystalline materials.
In this webinar we introduce X-ray Fluorescence Spectroscopy (XRF) which is a analytical technique used for elemental analysis of materials.
In this webinar we introduce Metal Based Additive Manufacturing Analysis to understand and evaluate many aspects of the metallurgy.
In this webinar we introduce Polymer Additive Manufacturing analysis that prevents defects in 3D-printed objects
In this webinar we introduce Multiscale Assessment on the Quality of Metal Powder Feedstocks for Additive Manufacturing
In this webinar we introduce the application of Electron Microscopy to Lithium Ion Batteries from Micron to Atomic Level
In this webinar we introduce full Survey Chemical Analysis of Materials Used in Energy Storage Devices such as lithium ion batteries
In this webinar we introduce analytical techniques for the characterization of Li-ion battery electrode (cathode) at different length scale
In this webinar, we will explore the variety of microscopy techniques available at Eurofins EAG commonly utilized to characterize compound semiconductor materials.
In the full webinar we will focus on analyses of modified glass surfaces and thin coatings using Secondary Ion Mass Spectrometry (SIMS).
In the full webinar we will focus on the PCOR-SIMS Analysis of GaAs pHEMT and GaN HEMT using Secondary Ion Mass Spectrometry
In this webinar we introduce the analytical approaches for solving food and beverage challenges including contamination.
In this webinar we introduce Analytical Investigations of Plastics and Polymers to tackle failure issues quickly and effectively
In the full webinar we will introduce analyzing VCSELs with a focus on secondary ion mass spectrometry (SIMS)
In the full webinar we answer pre-submitted questions from our audience about Secondary Ion Mass Spectrometry
October 11, 2023
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding materials analysis with various X-ray and ion beam analytical techniques.
October 25, 2023
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding characterization of polymeric materials used for product development, R&D, and failure analysis.
March 22, 2023
RGA is ideally suited for process development, sealing quality control, studying long-term outgassing of the enclosed materials inside the components, and for product qualification.
X-ray diffraction (XRD) is a powerful and versatile technique that can give detailed structural information about almost anything that is solid.
Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.
Demand for compound semiconductors has rapidly grown recently. During this live event we answered questions surrounding the Materials Characterization of GaN HEMT power transistors.
July 19, 2023
FTIR, Raman and NanoIR are particularly well suited at determining the identity and molecular structure of organic materials, however they can also obtain some inorganic information too.
In the full webinar we introduce Characterization and Failure Analysis of Optoelectronic Materials and Devices
In the full webinar we will discuss how the surface properties of polymers are altered by plasma treatment using characterization techniques
In the full webinar we will focus Full Survey Chemical Analysis of
Plasma Resistant Ceramic Coatings using GDMS
In this webinar we introduce EAG Analytical Capabilities in Europe at our Eindhoven and Toulouse Laboratories
In this webinar we introduce Environmental chamber clean analysis that identifies contamination that can ruin your qualifications.
In this webinar we introduce Extractable and Leachable tests which identify chemical components that can migrate out of a product.
In the full webinar we will focus on Glass Analysis looking at Chemical and Physical Measurements to address manufacturing issues
In this webinar we introduce Accelerated Life Testing and Failure Analysis techniques at EAG Laboratories Eindhoven
In the full webinar we introduce MicroLED Analysis for improved understanding of III-nitride material properties and growth/device processes
In this webinar we introduce Particle Characterization by analyzing and reducing particulate matter and contamination
In this webinar we introduce Leachables stability studies and will cover impurities, method and stability requirements.
In the full webinar we will discuss Thin Film Analysis that looks at film composition, thickness, and uniformity.
In this webinar we introduce evaluating wearable safety including product recall, lawsuits, and regulatory agency inquiries.
In this webinar we introduce EAG Laboratories advances in Materials and Surfaces Characterization of Medical Devices
In this webinar we introduce how a 3rd Party Analytical Lab Can Help Support Your Company’s Compliance with EU’s MDR
In this webinar we introduce Characterization of Bioceramics for Surgical Implants using analytical tools for full qualification
In this webinar we introduce Chemical Compatibility of Polymers in Medical Devices and prevent material problems in the field
In this webinar we introduce Deformulation of Pharmaceutical RLDs and understanding the Q1/Q2 Sameness Requirements for Complex Generics
ATE testing automates and streamlines the testing process of microelectronic devices by using specialized hardware and software to perform a wide range of functional tests under various conditions. Come learn more about ATE and what EAG can do for you.
Damage caused by ESD is one of the primary failure mechanisms for integrated circuits. Testing susceptibility to ESD events is crucial in the success of electronic devices and is essential for the qualification process.
In this webinar we introduce Microelectronic Component Product Qualification to understand and consider component reliability.
In this webinar we introduce Dye and Pry that involves cleaning a sample to remove debris & flux around solder, then exposing it to a red dye.
In this webinar we introduce failure analysis of ICs and other components in the product development cycle and for improving current products
In this webinar we introduce electrostatic discharge (ESD) testing which is one of the failure mechanisms for integrated circuit parts
In this webinar we show how EAG troubleshoots electronic system failures using a multidisciplinary approach
In this webinar we introduce The Failure Analysis of Reliability Testing Samples as applied electronic and semiconductor devices
In this webinar we introduce FIB Circuit Edit which allows the cutting of connections and placement of new lines in a semiconductor die
In this webinar we introduce latch-up testing which is relevant for CMOS devices with high static power dissipation.
In this webinar we introduce the Testing of High Speed I/O to validate the devices from characterization to production
In this webinar we introduce Warpage and Strain Characterization used for non-contact, full-field acquisition of 3D topographies.
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