Ask the Expert: Auger, TOF-SIMS, XPS

During this live Ask the Expert event, we will answer pre-submitted questions from our audience about our surface sensitive analytical techniques: Auger Electron Spectroscopy (Auger), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS).

Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.

Auger utilizes a high-energy electron beam as an excitation source. This technique is an extremely useful tool for elemental analysis of small surface features.

TOF-SIMS focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions in a sputtering process. This technique is widely used to characterize surfaces and surface contaminants.

XPS, also known as ESCA, is used to determine quantitative atomic composition and chemistry. The process works by irradiating a sample with soft x-rays.

Do you want a deeper understanding of surface analysis? Are you new to the industry and want to learn what Auger, TOF-SIMS and XPS can do for you? If so please join us for an intimate Q&A with Eurofins EAG Laboratories technique experts. During this 60-minute session our experts will answer pre-submitted questions from our audience. If time runs out and all questions have not been answered a follow up email will be sent out to all attendees with those answers.

Related Resources


  • Sachin Attavar, Ph.D.
    Senior Scientist
  • Sasha Rodnyansky
    Principal Scientist
  • Juergen Scherer, Ph.D.
    Principal Scientist
  • Lori LaVanier
    Manager Surface Science

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