In addition, please read our application note, High Resolution X-Ray Diffraction (HR-XRD) Measurement of Compound Semiconductors, for a discussion of how this method may be used to determine composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, and other materials.
In conclusion, EAG offers our customers XRD services to analyze many materials. Moreover, you can count on fast turnaround times, accurate data, and person-to-person service, ensuring you understand the information that you receive.