EAG has a new highly customized XRD/XRR instrument to help our clients solve challenging problems that require the analysis of small areas or volumes.
The Eurofins EAG XRD/XRR lab routinely analyzes both polycrystalline and epitaxial thin films. XRR data provides information about film density, thickness, and roughness. Typical XRD analyses include qualitative phase identification, semi-quantitative phase analysis, %crystallinity, crystallite size, texture, residual stress and much more. Due to film thickness, data for many of these analyses are acquired by grazing incidence XRD (GIXRD) to maximize the X-ray signal from the film and minimize any interference from the substrate. High-resolution XRD (HRXRD) is used to measure composition and strain/relaxation of epitaxial thin films.