Atomic Force Microscopy (AFM) analysis provides images with near-atomic resolution for measuring surface topography. It is capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM analysis can also provide quantitative measurements of feature sizes, such as step heights and other dimensions. Additionally, advanced modes of atomic force microscopy measurements allow for the qualitative mapping of various other physical properties, such as adhesion, modulus, dopant distribution, conductivity, surface potential, electric field, and magnetic domains.
What is the use of Atomic Force Microscopy?
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