Unlike many of the analytical techniques at EAG, Atomic Force Microscopy (AFM) and Optical Profilometry (OP) do not measure chemical composition. Instead, they provide 3D images of surfaces that show topography and texture and can determine roughness statistics and critical dimensions. Characterizing surface roughness is of importance because it can impact the performance and function, appearance, and tactility of a material. In addition, AFM can deliver much more than standard topography imaging. Using specialized probes and sensors, it is possible to map various electrical and physical properties (e.g. dopant distribution or modulus variations). When used together, OP and AFM can reveal the most complete picture of a surface’s topography, from the macro-scale (such as shape and bow) down to the nano-scale.
This webinar will introduce you to AFM, advanced AFM-based techniques, and OP, with a brief overview of the theory of each technique and representative examples of them in action.
In this webinar we will cover:
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