PED analysis provides visualization of material phase, crystal structure and strain level at nanometer (nm) scale. Typical applications of PED include phase mapping, crystal grain orientation mapping, grain size distribution analysis, texture analysis, grain boundary analysis on poly-crystalline materials, and strain level mapping on single crystalline materials.
PED analysis is a great complement to other structural analysis techniques, such as Scanning Electron Microscopy (SEM) based Electron Backscatter Diffraction (EBSD) and X-Ray Diffraction (XRD). Performed in Transmission Electron Microscopy (TEM) setting, PED offers visualization of structural information at higher resolution, but often requires more complex sample preparation. Eurofins Nanolab is the only service lab to offer PED analysis services to all users.
Contact us today for your Precession Electron Diffraction (PED) needs at +1 800-366-3867 or please complete the form below to have an EAG expert contact you.
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