New technologies and industries are emerging in recent years, for example facial recognition, autonomous driving, virtual reality, 5G communication etc.
For engineers, these fascinating technologies typically resonate with FinFET, VCSEL, III/V compound semiconductors; while for electron microscopists, these indicate hetero-epitaxy, cubic and hexagonal lattices, and associated failures in devices that often have complicated 3D structures.
In this webinar, we will introduce the fundamental principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.
In this webinar we will cover:
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