Optical profilometry (OP), also known as White Light Interferometry (WLI), is a non-contact interferometric-based method for characterizing surface topography. A typical optical profilometer analysis provides 2D and 3D images for surface analysis, numerous roughness statistics, and feature dimensions. In addition to these standard measurements, EAG can also perform many advanced optical profilometry analyses with our state-of-the-art Bruker Contour GTX-8 3D and NPFlex optical instruments. These include:
OP is suitable for numerous applications and sample types because it can accommodate many sample geometries, offering a wide range of possible analytical dimensions and a versatile Z-range, covering a broad range of potential surface roughnesses. EAG is committed to working with our clients to develop unique approaches for characterizing the topographies of even the most challenging samples with our 3D optical microscopy capabilities.
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