TEM

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This plot shows GDMS data acquired from eight LiFePO4 cathode samples from a range of suppliers.

Battery Technology

Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity

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semiconductor device

Benefits of Image Processing

Image processing can be used to generate high density critical dimension measurements that allow us to extract the full profile of the interfacial roughness in a multilayer stack.

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LIDAR technology

Checking Local Bonding in VCSEL Apertures

There are many key components of the VCSEL, but one challenging region is the oxide aperture. The oxide aperture is responsible for current confinement, and it is important to have high quality oxidation to prevent failure of the device.

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LED Analysis Brochure header

LED Analysis

LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.

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PED

PED Webinar

In this webinar we introduce Precession Electron Diffraction (PED) which has been essential to nano-scale structural analysis

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SMST 2024

SMST 2024

May 6-10, 2024
Eurofins EAG Laboratories will be presenting “Thermal Oxide Characterization – Heat Treat Modality vs. Composition“ on May 10th. We hope to see you there!

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TEM

TEM Webinar

In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.

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LED Computer Mouse

Uniformity is Key in Epitaxial Growth

AC-STEM analysis can provide a visual representation of non-uniformities in an active region. Roughness can easily be observed within interfaces. EDS maps can then be used to corroborate the roughness in relation to composition.

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