Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP
Airborne molecular contamination in cleanrooms lead to AMC defects in the electrical properties of wafers: Analysis by FTIR, GC/MS,TOF-SIMS .
November 2, 2023
Please join us for coffee and conversations! Enjoy a cup of coffee and pastries as you get to know our technical experts.
May 15, 2024
Please join us for coffee and conversations! Enjoy a cup of coffee and pastries as you get to know our technical experts.
Glass development and glass product verification requires the measurement of composition with high accuracy.
Cellphone screens are quite vulnerable to damage and are often protected with with a thin oleophobic coating.
Essentials of Particulate Testing: USP <788> and AAMI TIR42 While there are many standards available for particulate testing, USP <788> and AAMI TIR42 are the
TOF-SIMS is a technique that can observe elemental, inorganic and molecular species present on the outermost surface of a sample
Imaging Cross-Sections by TOF-SIMS provides molecular information with high spatial resolution for the distribution of organic molecules
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
One of our surface analysis techniques, TOF-SIMS, can be used to characterize the surface coatings on screens and to compare the thickness of the coatings using depth profiles.
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) detects organic contamination on surfaces of semiconductors.
The contact lens market has expanded beyond its original goal of vision correction to include products with decorative qualities.
XPS and TOF-SIMS to solve adhesive failure of a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene in a medical device.
In this webinar we introduce analytical techniques used by EAG for surface analysis – XPS, Auger and TOF-SIMS
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Cold stage analysis has been shown to be effective for samples that are not solids at room temperature or that have components that are volatile in a vacuum system, such as the antibacterial coated sutures.
Measuring the chemical state of the battery components such as the cathode, anode, separator, electrolyte, contact layers and additives, at various stages of cycling, provides vital information about the electrochemical processes that occur during battery use.
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.
EAG Laboratories can test for ionic or covalent bonds at our Sunnyvale, St. Louis, Minneapolis and Eindhoven facilities
In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
What is the difference between SIMS and TOF-SIMS? SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass
XPS Analysis for sputter etching polymers and other organic materials to provide chemical characterization and depth profiling
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