Airborne molecular contamination in cleanrooms lead to AMC defects in the electrical properties of wafers: Analysis by FTIR, GC/MS,TOF-SIMS .
November 2, 2023
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Glass development and glass product verification requires the measurement of composition with high accuracy.
Essentials of Particulate Testing: USP <788> and AAMI TIR42 While there are many standards available for particulate testing, USP <788> and AAMI TIR42 are the
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
XPS and TOF-SIMS to solve adhesive failure of a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene in a medical device.
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Cold stage analysis has been shown to be effective for samples that are not solids at room temperature or that have components that are volatile in a vacuum system, such as the antibacterial coated sutures.
Measuring the chemical state of the battery components such as the cathode, anode, separator, electrolyte, contact layers and additives, at various stages of cycling, provides vital information about the electrochemical processes that occur during battery use.
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.