Understanding Energy Density in Batteries
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
Surface Analysis Webinar
In this webinar we introduce analytical techniques used by EAG for surface analysis – XPS, Auger and TOF-SIMS
TOF-SIMS Webinar
In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.
Multiscale assessment on the quality of metal powder feedstocks for additive manufacturing
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
Depth Profiling of Thin Organic Films
Cellphone screens are quite vulnerable to damage and are often protected with with a thin oleophobic coating.
Compositional analysis of glass and glass products
Glass development and glass product verification requires the measurement of composition with high accuracy.
How to interpret TOF-SIMS spectra
TOF-SIMS is a technique that can observe elemental, inorganic and molecular species present on the outermost surface of a sample
What is the difference between SIMS and TOF-SIMS?
What is the difference between SIMS and TOF-SIMS? SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass
Pigmented contact lenses
The contact lens market has expanded beyond its original goal of vision correction to include products with decorative qualities.
Surface Characterization of Antibacterial Coated Sutures
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Battery Technology
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
Surface and Interface Characterization of Polymers
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Imaging Cross-Sections by TOF-SIMS
Imaging Cross-Sections by TOF-SIMS provides molecular information with high spatial resolution for the distribution of organic molecules
Root Cause Determination of Adhesion Failure in Medical Device Packaging
XPS and TOF-SIMS to solve adhesive failure of a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene in a medical device.
Organic Contamination on Surfaces
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) detects organic contamination on surfaces of semiconductors.
XPS Analysis with C60 Sputtering
XPS Analysis for sputter etching polymers and other organic materials to provide chemical characterization and depth profiling
Cleanroom Materials as Sources of Airborne Molecular Contamination
Airborne molecular contamination in cleanrooms lead to AMC defects in the electrical properties of wafers: Analysis by FTIR, GC/MS,TOF-SIMS .
Chemical Imaging of Pharmaceuticals
The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP
Testing ionic and covalent bonds
EAG Laboratories can test for ionic or covalent bonds at our Sunnyvale, St. Louis, Minneapolis and Eindhoven facilities