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Ask the Expert: Auger, TOF-SIMS, XPS

Ask the Experts: Auger, TOF-SIMS, XPS

Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.

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This plot shows GDMS data acquired from eight LiFePO4 cathode samples from a range of suppliers.

Battery Technology

Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity

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contamination control on compound semiconductor

Surface Contamination on Compound Semiconductors

Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.

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TOF-SIMS Webinar

In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.

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