
Understanding Energy Density in Batteries
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
Home » TOF-SIMS
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
In this webinar we introduce analytical techniques used by EAG for surface analysis – XPS, Auger and TOF-SIMS
In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
Cellphone screens are quite vulnerable to damage and are often protected with with a thin oleophobic coating.
Glass development and glass product verification requires the measurement of composition with high accuracy.
TOF-SIMS is a technique that can observe elemental, inorganic and molecular species present on the outermost surface of a sample
What is the difference between SIMS and TOF-SIMS? SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass
The contact lens market has expanded beyond its original goal of vision correction to include products with decorative qualities.
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Imaging Cross-Sections by TOF-SIMS provides molecular information with high spatial resolution for the distribution of organic molecules
XPS and TOF-SIMS to solve adhesive failure of a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene in a medical device.
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) detects organic contamination on surfaces of semiconductors.
XPS Analysis for sputter etching polymers and other organic materials to provide chemical characterization and depth profiling
Airborne molecular contamination in cleanrooms lead to AMC defects in the electrical properties of wafers: Analysis by FTIR, GC/MS,TOF-SIMS .
The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP
EAG Laboratories can test for ionic or covalent bonds at our Sunnyvale, St. Louis, Minneapolis and Eindhoven facilities
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