High reliability electronic components like integrated circuits are often required to operate for long periods of time, having little or no opportunity for replacement.
The type and degree of ingress protection that an enclosure possesses is described by the Ingress Protection (IP) rating.
In this webinar we introduce Accelerated Life Testing and Failure Analysis techniques at EAG Laboratories Eindhoven
Solving CSP qualification testing challenges by addressing key issues and applying specialized processes through EAG know-how.
Electronic system failure analysis requires expertise in the modes of failures and techniques such as SEM, TEM, and dual-beam FIB.