In this webinar we introduce The Failure Analysis of Reliability Testing Samples.
Dr. Daniel J. D. Sullivan of EAG Laboratories discusses the relationship between reliability testing and failure analysis, as applied electronic and semiconductor devices, originally presented to the IEEE Reliability Society, Santa Clara Valley Chapter on May 4, 2017.
The relationship between reliability testing and failure analysis is vital and symbiotic. Reliability testing is done for a wide variety of reasons. After failures are obtained, determining the failure’s causes, validating and verifying the related issues leads to developing corrective actions. Performing comprehensive failure analysis and finding corrective action is preferable to living with failures, retrying tests and hoping for better results, or making random changes to design and processing and repeating the testing.
In this webinar we will cover:
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