Ask the Expert: X-ray Diffraction (XRD)
April 5, 2023
X-ray diffraction (XRD) is a powerful and versatile technique that can give detailed structural information about almost anything that is solid.
XRD Webinar
In this webinar we introduce X-ray Diffraction (XRD) which is a analytical technique for the examination of crystalline materials.
MicroXRR & MicroHRXRD
EAG has a new XRD/XRR instrument to help our clients solve challenging problems that require the analysis of small areas or volumes.
Amorphous vs. Crystalline Materials
Solids fall under two main categories: amorphous and crystalline. These two types of solids have different properties that may be more beneficial for certain products or applications.
Identification of Unknown Powders
This paper describes identification of two unknown powders using Raman spectroscopy, combined with two X-ray techniques
Characterization of Bioceramics for Surgical Implants: Part I – Precursor Qualification
This paper will demonstrate how analytical tools can be used for the quality control of hydroxyapatite and β-tricalcium phosphate powders
Analysis of refractory materials
XRD and EDS analysis of refractory materials that are typically used in glass tank furnaces are zirconia, alumina and silica-based bricks.
High Resolution XRD – Epitaxial film composition
How to determine the composition of epitaxial thin films by X-ray diffraction and will focus on the analysis of AlxGa1-xAs thin films.
Crystallite size determination using XRD
XRD analysis shows the crystallite size can be evaluated at half maximum of a diffraction peak as the crystallite size decreases.
The Art and Science of Paint Deformulation
Paint deformulation separates out components to be identified with the normal analytical techniques available to the chemist.
Structural and Chemical Characterization of Li-ion Batteries
Structural and Chemical Characterization of Li-ion Batteries help to understand why batteries fail leading to safer products and improvements.
X-ray Diffraction (XRD) Services
X-ray Diffraction XRD Services from EAG Laboratories is a powerful nondestructive technique for characterizing crystalline materials.
III-V Multi-Junction PV – Application Discussion
III-V solar cell technology for concentrator PV systems is the focus of this app note, illustrating the way that surface analysis can help
Surface Analysis of α-Si, µc-Si Thin Film PV
Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC
Analysis of CIGS Thin Film PV
CIGS Thin Film PV performance reliability and uniformity as manufacturing is scaled up, can be optimized using materials characterization.
High Resolution X-ray Diffraction (HR-XRD) Measurement of Compound Semiconductors
HR-XRD Measurement of Compound Semiconductors can be used to determine the composition of strained layers and thickness.