AES Webinar
This webinar is an introduction to Auger Electron Spectroscopy. It will include the principles of the technique with examples.
Analysis of CIGS Thin Film PV
CIGS Thin Film PV performance reliability and uniformity as manufacturing is scaled up, can be optimized using materials characterization.
Ask the Experts: Auger, TOF-SIMS, XPS
Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.
Auger Electron Spectroscopy (AES) Tutorial
Auger Tutorial by EAG, in this instrumentation overview we present the history of Auger, along with details regarding analyzers and detectors
Battery Technology
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
Biomedical Surface Analysis
Biomedical surface analysis looks at properties critical to medical and pharmaceutical products, and offer answers to difficult problems.
Characterization of Surface Contamination
A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.
Chemical analysis of glass defects
The chemical composition of all kinds of glass defects can be determined by SEM combined with EDS, XRF, Auger, and RGA.
Corrosion Resistance Study of Electropolished Medical Devices
Medical device corrosion resistance optimized by using Auger depth profile & oxide layer thickness for device surface characterization.
Fracture Analysis of Metal Grain Boundary Segregation by Auger
Characterization of metallurgical failures includes identifying segregation of elemental impurities to the surface of grain boundaries.
Full Wafer Particle Analysis of sub-50nm Defects by Auger Electron Spectroscopy
Auger (AES) spectra of small defects of various sizes shows excellent sensitivity is maintained down to a defect size of only 20nm.
Identification of Interface Contamination Using Auger Electron Spectroscopy (AES)
Auger Identification Interface Contamination is discussed regarding the elimination of contaminants for successful semiconductors.
LED Analysis
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
Medical Device Electronics: Improving Reliability with Auger Electron Spectroscopy
Auger Electron Spectroscopy applied to electronic circuitry problems involving the integrity of wire or ball bonding to metallic bond pads.
Multiscale assessment on the quality of metal powder feedstocks for additive manufacturing
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
Oleophobic Coatings on Cellphone Screens
One of our surface analysis techniques, TOF-SIMS, can be used to characterize the surface coatings on screens and to compare the thickness of the coatings using depth profiles.
Particle Analysis Services
Particle analysis helps with black speck analysis, contamination identification, particulate analysis, identification of unknown materials.
Stainless Steel Corrosion: Medical Device Applications with Auger
Auger Electron Spectroscopy (AES) is effective in determining the quality of passivation layers to prevent corrosion in medical devices.
Surface Analysis Webinar
In this webinar we introduce analytical techniques used by EAG for surface analysis – XPS, Auger and TOF-SIMS
Understanding Energy Density in Batteries
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
What is the relationship between Auger analysis and EDS analysis?
Both Auger Electron Spectroscopy (AES) and Energy Dispersive X-ray Spectroscopy (EDX / EDS) are used for elemental analysis.