Compound Semiconductors

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Ask the Expert - ICP

Ask the Expert: Elemental Analysis with ICP

June 27, 2024
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Elemental Analysis with Inductively Coupled Plasma (ICP-OES, ICP-MS, LA-ICP-MS). These techniques provide full survey major, minor, trace element analysis, and purity certification for up to 69 measurable elements.

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LED Analysis Brochure header

LED Analysis

LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.

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contamination control on compound semiconductor

Surface Contamination on Compound Semiconductors

Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.

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TEM

TEM Webinar

In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.

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LED Computer Mouse

Uniformity is Key in Epitaxial Growth

AC-STEM analysis can provide a visual representation of non-uniformities in an active region. Roughness can easily be observed within interfaces. EDS maps can then be used to corroborate the roughness in relation to composition.

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