Compound semiconductors are used everywhere! We rely on them every day, from the simple things such as a computer mouse and laser printer, to advanced applications such as LIDAR (laser imaging, detection, and ranging) and autonomous driving. Regardless of the end product, planning and research in the early stages of product development can help to maximize performance and decrease the probability of failures in the future.
The structural and compositional uniformity during epitaxial growth of compound semiconductors is critical for developing reliable and efficient devices. Many different types of defects and non-uniformities can occur during growth which can hinder final device performance. Therefore, it is very important to assess epitaxy quality before device fabrication steps. EAG can help!
During epitaxial growth, an issue in a single layer can affect the entire structure of a device causing non-uniformities in thickness and composition. AC-STEM with EDS can be utilized to understand epitaxial variations that span from the nanoscale to the atomic scale during growth.
AC-STEM imaging is essential towards studying these types of fine sample features because bulk techniques lack the necessary spatial resolution. By combining this type of analysis with other Eurofins EAG services such as SIMS, it is possible to gain a clear understanding of the epitaxy structure and composition with atomic scale resolution and dopant level composition sensitivity.
Contact us today to learn how we can help you on your next project.
June 27, 2024
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Elemental Analysis with Inductively Coupled Plasma (ICP-OES, ICP-MS, LA-ICP-MS). These techniques provide full survey major, minor, trace element analysis, and purity certification for up to 69 measurable elements.
Uncover the invisible architecture of semiconductors with depth profiling using ion-TOF SIMS. This advanced technique reveals layer-by-layer composition in materials like silicon, GaN, and SiC. Learn how Eurofins EAG Laboratories supports your analysis with state-of-the-art tools and world class expertise.
Electrochromic Glass, also known as smart glass, is a newer technology which allows users to turn glass opaque when needed, and clear when not.
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.
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