MicroLED Analysis Webinar

In the full webinar we introduce MicroLED Analysis for improved understanding of III-nitride material properties and growth/device processes.

MicroLED is largely recognized as the ultimate display technology and is one of the fastest-growing technologies in the world today. MicroLED is a technology that has the potential to transform the display industry. Increased brightness, reduced power, extended lifetimes, unlimited form-factors and always-on displays are many of the promises that microLED displays look to deliver.

Despite the remarkable progress, many opportunities remain for taking advantage of improved understanding of the basic III-nitride material properties and growth/device processes to benefit the further development of microLED technology.

In this webinar we will cover:

  • Review the characterization techniques for III-V devices including
    • SIMS
    • TEM
    • Atom Probe Tomography (APT)
    • Cathode Luminescence (CL)
    • sMIM
    • & other techniques
  • Overview of additional issues for microLEDs
  • Q&A from a panel of EAG technique experts

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