Using a special sample preparation technique and a new SIMS analytical protocol, individual SiC particles with a size ranging from 100 um to 500 um in a SiC powder sample can be analyzed.
This innovative approach eliminates contributions from surface contamination to bulk concentration.
N profiles for two different SiC particles from the same batch of powder samples. The SIMS results for these two particles show good batch bulk concentration consistency.
Contact us today for your SIMS Analysis of Individual SiC Particles needs at +1 800-366-3867 or please complete the form below to have an EAG expert contact you.
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