EAG Laboratories has developed expertise in identifying and characterizing particles of an unknown origin with individual and combined compositional analysis techniques in conjunction with expert data interpretation. We have developed a proprietary library of FTIR, LC-MS and GC-MS spectra to speed particle identification investigations.
We have used many different particle analysis techniques, including Fourier Transform Infrared Spectroscopy (FTIR), Raman Spectrometry, Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF) and scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM-EDS).
Once we determine the chemical nature of the particulate material, it may become important to gain a better understanding of the composition through further material characterization.
Armed with a particle analysis, we help our clients to:
- Determine the potential source of the identified material
- Compare the chemistries of two different particulates
- Confirm the identity of a suspected material