Li-Ion electrodes are more than just energy suppliers; they’re intricate mazes of structures and materials. Their design and intricate layout play pivotal roles in determining a battery’s capacity, discharge rate, and overall lifespan.
23rd October 2022
Industry Service Labs play a critical role in the battery community by providing fast and professional service. Learn how Eurofins EAG Laboratories can help!
SEM-Cathodoluminescence is used for a wide variety of luminescent materials and devices. It allows for the inspection of optical properties with sub-um spatial resolutions combined with SEM imaging having 3-5nm spatial resolution.
Besides images provided by SEM and TEM, different attachments can be added to reveal crystalline information, including (SEM-EBSD) and TEM (TEM-PED).
Cryogenic focused ion beam and scanning electron microscopy is a technique used to reduce damage caused by ion and electron beams.
Application of SIMS, XPS/ESCA, SEM and ICP-MS to test for appearance of glass lamellae in parenteral pharmaceutical solutions, by EAG
SEM-EDS and RAMAN analytical testing laboratory techniques applied to identification of foreign material contamination on pharmaceuticals.
Surface cleanliness is critical in how a material or a layer on a product interacts with other surfaces, which in turn can affect its functionality.
EAG divides FA tasks into three levels. In each level, we employ optimal techniques for device characterization, defect localization, and root cause failure analysis.
6th September 2019
Morphology and Particle Analysis measures particle size and shape along with particle chemistry, for high throughput elemental analysis.
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
PFIB differs from traditional FIB in that it uses various gases such as Xe, Ar, oxygen or nitrogen to generate a plasma that is used to remove material from a sample.
Electronic system failure analysis requires expertise in the modes of failures and techniques such as SEM, TEM, and dual-beam FIB.
When information is required from a compound seminconductor, EAG can depackage and deprocess the sample, & fully characterize it.
SEM coupled with EDS provides high-resolution and high-depth-of-field images of
the sample surface along with elemental identification.
Silicon carbide is increasingly considered a potential replacement for traditional silicon semiconductors due to its superior properties.
Structural and Chemical Characterization of Li-ion Batteries help to understand why batteries fail leading to safer products and improvements.
Supplier verification can be critical to the long-term success of your product and business. At Eurofins EAG, our technical experts have many years of experience working with battery materials. We are your battery partner to bring your product to market faster and more efficiently.
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.
SEM equipped with EDS can capture detailed images and identify elements simultaneously on the surface of samples.