Accelerating the Development of Lithium-Ion Batteries
23rd October 2022
Industry Service Labs play a critical role in the battery community by providing fast and professional service. Learn how Eurofins EAG Laboratories can help!
Advanced Microscopy of Compound Semiconductors
In this webinar, we will explore the variety of microscopy techniques available at Eurofins EAG commonly utilized to characterize compound semiconductor materials.
Analysis of CIGS Thin Film PV
CIGS Thin Film PV performance reliability and uniformity as manufacturing is scaled up, can be optimized using materials characterization.
Battery Technology
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
Biomedical Morphology
Biomedical Morphology and Microstructure through imaging analysis – characterizing crystallographic phase and producing elemental maps.
Cathodoluminescence Illuminates the SEM with New Capabilities
SEM-Cathodoluminescence is used for a wide variety of luminescent materials and devices. It allows for the inspection of optical properties with sub-um spatial resolutions combined with SEM imaging having 3-5nm spatial resolution.
Characterization of Crystalline structures – SEM-EBSD vs TEM-PED
Besides images provided by SEM and TEM, different attachments can be added to reveal crystalline information, including (SEM-EBSD) and TEM (TEM-PED).
Characterization of Surface Contamination
A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.
Dual Beam FIB-SEM: Sample prepping and Imaging
The Dual Beam FIB-SEM integrates a focused ion beam with a scanning electron microscope for simultaneous sample prepping and imaging.
EDS & EELS Webinar
In this webinar we introduce Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS)
Effects of Surface Roughness
The roughness of a surface and how it interacts with surrounding materials and elements can have a significant impact on material technology and its functionality.
Failure Analysis in Aerospace Advancement
In the aerospace industry, electronics are subjected to extreme environmental variables. EAG’s failure analysis group can help solve potential problems that may arise.
Glass Delamination in Pharmaceutical Vials Related to Surface Chemical Changes
Application of SIMS, XPS/ESCA, SEM and ICP-MS to test for appearance of glass lamellae in parenteral pharmaceutical solutions, by EAG
Identification of Foreign Material on Pharmaceutical Tablets
SEM-EDS and RAMAN analytical testing laboratory techniques applied to identification of foreign material contamination on pharmaceuticals.
In Vitro Diagnostics Testing
In Vitro Diagnostics test and system development support from the materials sciences experts at EAG Laboratories, contact us today!
Is my surface clean? Effects of Surface Cleanliness
Surface cleanliness is critical in how a material or a layer on a product interacts with other surfaces, which in turn can affect its functionality.
LED Analysis
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
Microscopy Techniques in the Failure Analysis of Optoelectronics
EAG divides FA tasks into three levels. In each level, we employ optimal techniques for device characterization, defect localization, and root cause failure analysis.
Morphology and Chemical Analysis of Particles now available
6th September 2019
Morphology and Particle Analysis measures particle size and shape along with particle chemistry, for high throughput elemental analysis.
Multiscale assessment on the quality of metal powder feedstocks for additive manufacturing
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
Plasma FIB – A better alternative to traditional FIB?
PFIB differs from traditional FIB in that it uses various gases such as Xe, Ar, oxygen or nitrogen to generate a plasma that is used to remove material from a sample.
Plasma FIB Services are Now Available
15th September 2023
EAG Laboratories is pleased to announce a new addition to our wide range of Advanced Microscopy techniques. We now offer Plasma FIB (PFIB) services!
Reducing System Failure Costs in Today’s Digitally Dependent World
Electronic system failure analysis requires expertise in the modes of failures and techniques such as SEM, TEM, and dual-beam FIB.
Reverse Engineering of Compound Semiconductor Optoelectronics
When information is required from a compound seminconductor, EAG can depackage and deprocess the sample, & fully characterize it.
Scanning Electron Microscopy (SEM)/ Energy Dispersive X-ray Spectroscopy (EDS)
SEM coupled with EDS provides high-resolution and high-depth-of-field images of
the sample surface along with elemental identification.
SEM-CL Webinar
In this webinar we will focus on SEM Cathodoluminescence (SEM-CL) Analyses for Materials such as compound semiconductors
SEM-EDS Webinar
In this webinar we will focus on Energy Dispersive X-ray Spectroscopy (EDS) and Scanning Electron Microscopy (SEM)
Silicon Carbide – A Powerful Semiconductor for the Future
Silicon carbide is increasingly considered a potential replacement for traditional silicon semiconductors due to its superior properties.
Structural and Chemical Characterization of Li-ion Batteries
Structural and Chemical Characterization of Li-ion Batteries help to understand why batteries fail leading to safer products and improvements.
Surface Analysis of α-Si, µc-Si Thin Film PV
Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC
Surface and Interface Characterization of Polymers
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
The Art and Science of Paint Deformulation
Paint deformulation separates out components to be identified with the normal analytical techniques available to the chemist.
Understanding Energy Density in Batteries
There is still so much to learn about batteries, including challenges such as energy density, cycle life, fast charge, and safety. In this blog, we’ll be focusing on energy density.
When Images Aren’t Enough – EDS and EELS
EDS and EELS can be coupled with SEM, STEM and TEM to determine the elemental composition, spatial distribution and segregation of elements.
Which method of sectioning is best for my sample?
Cross sectioning of a semiconductor die is a basic step in failure analysis work. A cross section can be used as a check of layer integrity.
Why Do Toothbrush Bristles Harden Over Time?
We investigate why Toothbrush bristles may begin to feel hard, stiff and rigid when compared to an unused toothbrush.