Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS) are powerful analytical techniques that are routinely used for semi-quantitative elemental analysis of a wide range of materials. When paired with Transmission Electron Microscope (TEM), they provide nanometer-level or even atomic-level direct observations into materials elemental distribution, which shine numerous applications in increasingly complex 3D structures in emerging techniques such as IOT, facial recognition, 5G communications, etc. In this webinar we will introduce the basics of TEM-based EDS and EELS, their respective benefits and limits, and cover a series of application case studies. A reverse engineering materials analysis report of a smartphone will also be discussed.
In this webinar we will cover:
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