Li-Ion electrodes are more than just energy suppliers; they’re intricate mazes of structures and materials. Their design and intricate layout play pivotal roles in determining a battery’s capacity, discharge rate, and overall lifespan.
In this webinar, we will explore the variety of microscopy techniques available at Eurofins EAG commonly utilized to characterize compound semiconductor materials.
XRD and EDS analysis of refractory materials that are typically used in glass tank furnaces are zirconia, alumina and silica-based bricks.
EELS and EDS coupled with STEM provides chemical composition along with structure information of materials.
Advances in thin film growth has created a need for characterizing structure and chemistry at the atomic scale using EDS.
This paper will demonstrate how analytical tools can be used for the quality control of hydroxyapatite and β-tricalcium phosphate powders
A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.
The chemical composition of all kinds of glass defects can be determined by SEM combined with EDS, XRF, Auger, and RGA.
The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP
EDS and EELS are elemental analysis techniques integrated with electron microscopes such as TEM (Transmission Electron Microscope)
Contamination of great concern to the pharmaceutical and medical device industry, two case studies illustrate investigative approach.
In this webinar we introduce Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS)
Essentials of Particulate Testing: USP <788> and AAMI TIR42 While there are many standards available for particulate testing, USP <788> and AAMI TIR42 are the
Fine control over structural and compositional uniformity during epitaxial growth of compound semiconductors is critical for developing reliable and efficient devices.
In the aerospace industry, electronics are subjected to extreme environmental variables. EAG’s failure analysis group can help solve potential problems that may arise.
SEM-EDS and RAMAN analytical testing laboratory techniques applied to identification of foreign material contamination on pharmaceuticals.
March 30 – April 3, 2025
Eurofins EAG Laboratories will be presenting a poster, Failure Analysis of Particle Contamination in Battery, at IRPS in Monterey, CA.
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
Particle analysis helps with black speck analysis, contamination identification, particulate analysis, identification of unknown materials.
Plastic deformulation studies help identify and quantify pigments, polymers, resins, impact modifiers, stabilizers and more in your products.
AC-STEM-EDS analysis is explored showing the effectiveness of this technique for characterizing ultrathin layers.
SEM coupled with EDS provides high-resolution and high-depth-of-field images of
the sample surface along with elemental identification.
In this webinar we will focus on Energy Dispersive X-ray Spectroscopy (EDS) and Scanning Electron Microscopy (SEM)
Silicon wafer solar cells and the analytical techniques used to investigate failures, bulk defects and other materials characterization.
Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.
AC-STEM analysis can provide a visual representation of non-uniformities in an active region. Roughness can easily be observed within interfaces. EDS maps can then be used to corroborate the roughness in relation to composition.
Both Auger Electron Spectroscopy (AES) and Energy Dispersive X-ray Spectroscopy (EDX / EDS) are used for elemental analysis.
EDS and EELS can be coupled with SEM, STEM and TEM to determine the elemental composition, spatial distribution and segregation of elements.
We investigate why Toothbrush bristles may begin to feel hard, stiff and rigid when compared to an unused toothbrush.
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