EDS Archives

Advanced Microscopy of Compound Semiconductors

In this webinar, we will explore the variety of microscopy techniques available at Eurofins EAG commonly utilized to characterize compound semiconductor materials.

Analysis of refractory materials

XRD and EDS analysis of refractory materials that are typically used in glass tank furnaces are zirconia, alumina and silica-based bricks.

Atomic Elemental Mapping by Simultaneous Dual EELS and EDS

EELS and EDS coupled with STEM provides chemical composition along with structure information of materials.

Atomic Resolution EDS

Advances in thin film growth has created a need for characterizing structure and chemistry at the atomic scale using EDS.

Characterization of Bioceramics for Surgical Implants: Part I – Precursor Qualification

This paper will demonstrate how analytical tools can be used for the quality control of hydroxyapatite and β-tricalcium phosphate powders

Characterization of Surface Contamination

A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.

Chemical analysis of glass defects

The chemical composition of all kinds of glass defects can be determined by SEM combined with EDS, XRF, Auger, and RGA.

Chemical Imaging of Pharmaceuticals

The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP

Comparison between EDS and EELS

EDS and EELS are elemental analysis techniques integrated with electron microscopes such as TEM (Transmission Electron Microscope)

FTIR Brown Contaminant Identification on Pill

Confronting Contamination Analytical Case Studies

Contamination of great concern to the pharmaceutical and medical device industry, two case studies illustrate investigative approach.

EDS & EELS Webinar

In this webinar we introduce Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS)

Essentials of Particulate Testing: USP <788> and AAMI TIR42

Essentials of Particulate Testing: USP <788> and AAMI TIR42 While there are many standards available for particulate testing, USP <788> and AAMI TIR42 are the

STEM imaging and EDS analysis in a thick AlGaN epitaxial layer grown on a GaN substrate.

Evaluating Epitaxy Quality in Compound Semiconductors Using AC-STEM/EDS

Fine control over structural and compositional uniformity during epitaxial growth of compound semiconductors is critical for developing reliable and efficient devices.

Failure Analysis in Aerospace Advancement

In the aerospace industry, electronics are subjected to extreme environmental variables. EAG’s failure analysis group can help solve potential problems that may arise.

Foreign material on a pill, as analyzed at EAG Laboratories

Identification of Foreign Material on Pharmaceutical Tablets

SEM-EDS and RAMAN analytical testing laboratory techniques applied to identification of foreign material contamination on pharmaceuticals.

LED Analysis

LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.

Particle Analysis Services

Particle analysis helps with black speck analysis, contamination identification, particulate analysis, identification of unknown materials.

Plastic Deformulation

Plastic deformulation studies help identify and quantify pigments, polymers, resins, impact modifiers, stabilizers and more in your products.

AC-STEM Z-contrast image of GaN:InGaN multilayer stack.

Quantification of Ultrathin Layers by AC-STEM-EDS

AC-STEM-EDS analysis is explored showing the effectiveness of this technique for characterizing ultrathin layers.

Scanning Electron Microscopy (SEM)/ Energy Dispersive X-ray Spectroscopy (EDS)

SEM coupled with EDS provides high-resolution and high-depth-of-field images of
the sample surface along with elemental identification.

SEM-EDS Webinar

In this webinar we will focus on Energy Dispersive X-ray Spectroscopy (EDS) and Scanning Electron Microscopy (SEM)

The schematic of a common Si solar cell structure above illustrates some of the ways that surface analysis can help. Note that cell structures with efficiencies in the 20% range have key differences.

Silicon Wafer PV – Application Discussion

Silicon wafer solar cells and the analytical techniques used to investigate failures, bulk defects and other materials characterization.

The schematic of the α-Si thin film PV (generic name for all the combined films) illustrates some of the ways surface analysis can help.

Surface Analysis of α-Si, µc-Si Thin Film PV

Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC

Figure 1 X-ray Photoelectron spectra of untreated and plasma treated polystyrene showing evidence of O and N on the treated film

Surface and Interface Characterization of Polymers

Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength

contamination control on compound semiconductor

Surface Contamination on Compound Semiconductors

Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.

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