SEM-CL analysis is typically used for direct bandgap semiconductors, primarily investigating GaN, InP and GaAs materials, but it can be applied to any type of sample that emits light under electron irradiation. It can help determine differences in composition with III-V materials and examine dopant level constituents. In addition to composition and structural information that the standard SEM offers, it provides insights on electro-optical properties and localization of crystal defects that are difficult to ascertain using any other methods.
The information provided by CL analysis can help guide our clients to modify their processes and improve the performance of their optoelectronic devices, such as lasers and LEDs.
At Eurofins EAG, we are your trusted partner in advanced microscopy analysis. We are one of the few commercial labs with the Attolight tool, offering SEM-CL services. With our years of experience and vast array of complementary analytical techniques, we can help determine the best suited techniques for your project.
Contact us today to learn how we can help you on your next project.