In this webinar we introduce FIB Circuit Edit or Circuit Edit Focused Ion Beam (CEFIB) which allows the cutting of connections and placement of new lines in a semiconductor die.
In the long and complicated process of designing and producing new integrated circuits, it is extremely valuable to be able to modify die to evaluate changes and corrects without having to go through a respin in the FAB.
The Circuit Edit Focused Ion Beam (CEFIB) allows the cutting of connections and placement of new lines in the die which can then be tested to ensure the modifications made are the correct ones without the additional time and expense (often weeks and hundreds of thousands of dollars) of making new masks and wafers.
In this webinar we will cover:
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