A Picture is Worth a Thousand Words – TEM, STEM and AC-STEM
TEM, STEM and AC-STEM techniques deliver high resolution images providing a detailed view of a material or product.
Dual Beam FIB-SEM: Sample Prepping and Imaging
Transmission electron microscopy (including aberration corrected scanning transmission electron microscopy) and scanning electron microscopy (SEM) are valuable techniques when analyzing a material’s morphology and chemistry or performing product failure analysis, but how are the samples prepared for these detailed imaging techniques?
The dual beam focused ion beam (FIB)-SEM is a powerful tool whose primary use is preparing samples for further detailed analysis. It can also be used to image the sample directly.
What is Dual Beam?
While a single beam tool only has one ion beam, the dual beam FIB-SEM integrates a focused ion beam with a scanning electron microscope.
The focused ion beam is used to finely cut, modify and/or image a sample surface, and the scanning electron microscope is used to collect high-resolution and high-depth-of-field images of the sample surface or FIB cross-section. By combining these techniques, the Dual Beam allows for sample prepping and imaging to happen simultaneously.
Advantages of Dual Beam FIB
As a sample preparation tool, the Dual Beam FIB-SEM has revolutionized sample preparation for SEM and TEM samples by making more precise cross sections, expanded the use of FIB by allowing for simultaneous preparation, imaging, and elemental analysis, and has allowed for more accurate cross sectioning for previously hard-to-section materials and products.
Dual Beam FIB can essentially be used for any type of materials analysis, including but not limited to semiconductors, batteries, medical devices, aerospace, and more.
EAG Laboratories has over 40 years of experience and our industry experts have the capability to assist with your analytical needs.
More content you might like...
Supplier Verification in Battery Manufacturing
Supplier verification can be critical to the long-term success of your product and business. At Eurofins EAG, our technical experts have many years of experience working with battery materials. We are your battery partner to bring your product to market faster and more efficiently.
RBS Webinar
In this webinar we will focus on Rutherford Backscattering Spectrometry (RBS) which is a thin film analysis technique
Extraction Expertise for Medical Device Chemical Characterization
EAG offers advanced expertise and a risk-based approach for medical device extractable study design and execution, including the latest FDA expectations.