X-ray Diffraction (XRD) is a common analytical technique for the comprehensive examination of the structure of crystalline materials; in other words, scanning a material’s fingerprint. Often used for identifying and quantifying material phases and investigating crystallinity, this robust technique is capable of so much more. X-ray Reflectivity (XRR) is a complementary technique commonly used for the characterization of thin film materials, providing thin film layer thicknesses, densities, and roughness values. Both of these techniques stand on their own as essential tools in an engineer’s toolkit, but when used together or in conjunction with supplementary techniques, provide a holistic approach to real-world problem-solving.
The aim of this webinar is to introduce you to the fundamental principles of XRD and XRR with a focus on practical examples that illustrate the power of this technique on its own and as a supplement for other techniques.
In this webinar we will cover:
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