Boron Carbide for Use in Industrial and Life Saving Products
The elemental purity of boron carbide can be measured using several methods offered by Eurofins EAG Laboratories
Increase the Reliability of Products in the Field with DPA
Long-Term Reliability for Electronic Components
High reliability electronic components like integrated circuits are often required to operate for long periods of time, having little or no opportunity for replacement.
The long-term reliability of these components is especially important to the defense, aerospace, and automotive industries.
Destructive Physical Analysis (DPA)
Destructive Physical Analysis (DPA) is a systematic detailed examination of components during various stages of physical disassembly. Parts are examined for a wide variety of design, workmanship, and processing problems that may not show up during normal screening tests.
DPA test is routinely used by the aerospace industry to qualify electronic components. More and more commercial applications are using DPA screening to dramatically increase the reliability of their products in the field.
More Than 50 Years of DPA experience
Eurofins EAG Laboratories (formerly SEAL Laboratories) has been performing Destructive Physical Analysis (DPA) since 1972 on materials used in aerospace, commercial, military, and government applications.
With more than a half century of experience performing Destructive Physical Analysis, we can test your product for all standards.
• Integrated circuits
• Transistors
• Diodes
• Capacitors
• Resistors
• Relays
• Fuses
• Temperature sensors
• Filters, crystals
• Transformers, inductors, coils
• RF devices, microwave components
• Connectors, switches
• Hybrids containing multi-components
Our facilities are complete and DLA certified for Residual Gas Analysis/Internal Water Vapor (RGA), Particle Impact Noise Detection (PIND) X-Ray Radiography and SEM Inspection. Additional testing capabilities include External Visual Inspection, Hermetic Seal Testing (Fine Leak, Gross Leak), Delid/Decap/Case Removal, Internal Visual Inspection, Bond Pull Strength, Die Shear, SEM Inspection and Microsectioningelec.
More content you might like...
Lithium Ore and Concentrates for Battery Production and Beyond
Eurofins EAG Laboratories stands ready to assist in the analysis of lithium-ion batteries from the raw material supply chain through to the finished product and eventual recycling.
Materials Characterization for a Semiconductor Testing Customer
EAG’s material and microelectronic testing service is dedicated to providing the best information from ensuring the purity of starting materials, to prototype testing of devices in the ramp up towards full-scale production.
Cathodoluminescence Illuminates the SEM with New Capabilities
SEM-Cathodoluminescence is used for a wide variety of luminescent materials and devices. It allows for the inspection of optical properties with sub-um spatial resolutions combined with SEM imaging having 3-5nm spatial resolution.