Atom Probe Tomography (APT) is a new material analysis technique that provides three-dimensional (3D) chemical and spatial maps at the atomic scale. APT is unique in its ability to obtain chemical distributions across grain boundaries, heterojunctions, thin films and buried interfaces for metallic systems, ceramics, semiconductors and oxides. Identifying the location and concentration of chemical species is important as they directly affect performance and longevity. APT also enables 3D analysis of low atomic number (Z) elements such as H, B and Li which cannot be carried out with other advanced analytical techniques such as STEM-EDS (scanning transmission electron microscopy- energy dispersive x-ray spectroscopy) and SIMS (secondary ion mass spectrometry).
EAG Laboratories provides the world’s first and only commercial APT analysis that can cover a wide range of applications across industries such as semiconductors, energy generation and optical lighting.
In this webinar we will cover:
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